Introductory description

Characterising and, where possible, controlling the structure of materials is one the most important areas of research in science. The microscopic structure of a material determines its mechanical strength, its electrical properties and, at surfaces, the way the material interacts with the outside world (for example as a catalyst, in electrical contacts or as it corrodes). The first half of this module looks at the methods for identifying and studying structure. The second half studies how the distribution of charge and current flows affect the structural and electrical properties of insulators and semiconductors.

Module web page

Module aims

Outline syllabus

This is an indicative module outline only to give an indication of the sort of topics that may be covered. Actual sessions held may differ.

1. Revision of second and third year material on bonding, crystal structure and symmetry; Crystal growth; Phase Transitions and Phase Diagrams; Kinematical X-ray diffraction: revision, theory and analysis; Real crystals and their defects; Surfaces, thin films and growth techniques

2. Electron diffraction and imaging for materials characterisation -Introduction to Transmission Electron Microscopy (TEM): Resolution with electrons, Electron scattering, Instruments to achieve atomic resolution; Electron diffraction from crystals: Indexing diffraction patterns; Bright field and dark field imaging, Atomic resolution contrast mechanisms, STEM Z‑contrast imaging, Defects and interface characterisation, 3D imaging; Practical aspects of the techniques

3. Semiconductors Devices; Revision of second and third year material on semiconductors and the photoelectric effect; electronic transport in semiconductor devices; metal-semiconductor contacts; Metal-oxide-semiconductor transistors; Devices based on quantum tunnelling; Non-volatile memories; Piezoelectric and pyroelectric materials and applications; Ferroelectric materials and multiferroics

Learning outcomes

By the end of the module, students should be able to:

• Describe experimental techniques to measure physical properties of materials
• Characterise crystal structures
• Explain the operation of an electron microscope and how to interpret the data obtained
• Describe the physics of some semiconductor devices
• Explain piezo- pyro- and ferroelectricity and its uses

Indicative reading list

M.T. Dove, Structure and Dynamics, OUP; S. R. Elliott, The physics and chemistry of solids, Wiley; D.P. Woodruff and T.A. Delchar, Modern Techniques of Surface Science, CUP; S Blundell, Magnetism in Condensed Matter, OUP.

View reading list on Talis Aspire

Subject specific skills

Knowledge of mathematics and physics. Skills in modelling, reasoning, thinking.

Transferable skills

Analytical, communication, problem-solving, self-study